The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2020

Filed:

Feb. 26, 2016
Applicant:

Sikora Ag, Bremen, DE;

Inventor:

Harald Sikora, Bremen, DE;

Assignee:

Sikora AG, Bremen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3581 (2014.01); G01B 11/06 (2006.01); G01J 5/10 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0625 (2013.01); G01J 5/10 (2013.01); G01N 21/3581 (2013.01);
Abstract

A device for measuring the diameter and/or the wall thickness of a strand that has a substantially circular cross-section and is guided through the device by guide means in the direction of its longitudinal axis includes at least one transmitter for transmitting terahertz radiation, at least one radiation optical system that conducts the terahertz radiation to a strand guided by the device, at least one reflector for the terahertz radiation arranged opposite a transmitter and behind the strand in the radiation direction of the terahertz radiation, at least one receiver for receiving the terahertz radiation reflected at the strand and/or the reflector, and an evaluation apparatus that determines the diameter and/or the wall thickness of the strand using the measuring signals received by the at least one receiver. A corresponding method is also described.


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