The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Jan. 20, 2017
3shape A/s, Cophenhagen K, DK;
Ashwani Kumar, Copenhagen S, DK;
Deepak Vijayakumar Nair, Brønshøj, DK;
Erik Ask, Malmö, SE;
Karl-Josef Hollenbeck, København Ø, DK;
3Shape A/S, Kobenhavn K, DK;
Abstract
Disclosed is an optical coherence tomography scanner and a method for recording sub-surface scans of an object, wherein a position encoder is arranged in the path of the probing beam of an interferometric system. The encoder pattern is detected in a sequence of A scans at generated for different probing beam positions on the scanned object, the probing beam position and/or inclination for at least one A scan of said sequence of A scans is deducing based on the detected encoder pattern, and the sub-surface scan of the object is generated based on the sequence of A scans taking into account the deduced probing beam position and/or inclination.