The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2020
Filed:
Aug. 09, 2016
Thorlabs Gmbh, Dachau/München, DE;
Medizinisches Laserzentrum Lübeck Gmbh, Lübeck, DE;
Peter Koch, Lübeck, DE;
Gesa Franke, Lübeck, DE;
Hendrik Spahr, Lübeck, DE;
Helge Sudkamp, Lübeck, DE;
Gereon Hüttmann, Lübeck, DE;
Dierck Hillmann, Lübeck, DE;
Reginald Birngruber, Lübeck, DE;
Medizinisches Laserzentrum Luebeck GmbH, , DE;
Thorlabs GmbH, , DE;
Abstract
The invention relates to an interferometric method, in which the light scattered by an object is imaged onto an electronic camera, wherein a sample light component is assigned to scattering sites on a sectional face in the interior of the object. This sample light component can be separated from the contributions of the other sample light components by processing of the camera image and leads to a sectional image. A particular advantage of the invention lies in the fact that multiple parallel sectional faces can be exposed sequentially at predetermined intervals from each other in the interior of the object. Such a sequence of sectional images can be used to calculate a solid model of the object.