The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Dec. 30, 2019
Applicant:

Kardium Inc., Burnaby, CA;

Inventors:

Daniel Robert Weinkam, Coquitlam, CA;

Shane Fredrick Miller-Tait, North Vancouver, CA;

Fernando Luis de Souza Lopes, Delta, CA;

Assignee:

KARDIUM INC., Burnaby, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/046 (2006.01); A61N 1/39 (2006.01); G01K 7/16 (2006.01); H05K 1/18 (2006.01); H05K 1/02 (2006.01); H05K 1/11 (2006.01); G01K 1/02 (2006.01); G01K 13/00 (2006.01); A61B 18/14 (2006.01); A61B 5/042 (2006.01); A61B 18/12 (2006.01); A61N 1/05 (2006.01); H05K 1/16 (2006.01); A61B 18/00 (2006.01);
U.S. Cl.
CPC ...
H05K 1/028 (2013.01); A61B 5/046 (2013.01); A61B 5/0422 (2013.01); A61B 18/1206 (2013.01); A61B 18/1492 (2013.01); A61N 1/39 (2013.01); G01K 1/026 (2013.01); G01K 7/16 (2013.01); G01K 13/002 (2013.01); H05K 1/115 (2013.01); H05K 1/18 (2013.01); A61B 2018/00267 (2013.01); A61B 2018/00357 (2013.01); A61B 2018/00577 (2013.01); A61B 2018/00702 (2013.01); A61B 2018/00839 (2013.01); A61B 2018/00988 (2013.01); A61B 2562/166 (2013.01); A61N 1/056 (2013.01); H05K 1/167 (2013.01); H05K 2201/0979 (2013.01); H05K 2201/09681 (2013.01); H05K 2201/10151 (2013.01); H05K 2201/10507 (2013.01);
Abstract

Some aspects of this disclosure generally are related to improving the robustness of a flexible circuit structure, for example, by providing fault-tolerant electrical pathways for flow of electric current through the flexible circuit structure. In some embodiments, such fault tolerance is enhanced by way of a conductive mesh provided between an adjacent pair of resistive elements. Some aspects are related to improved voltage, current, or voltage and current measurement associated with various pairs of adjacent resistive elements at least when the various pairs have differing distances between them.


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