The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Nov. 26, 2018
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Jaime Rene De La Cruz, Carrollton, TX (US);

Jeffrey Mathew Kempf, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/00 (2006.01); G06T 7/70 (2017.01); G06T 7/521 (2017.01); H04N 9/31 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3185 (2013.01); G06T 5/006 (2013.01); G06T 7/521 (2017.01); G06T 7/70 (2017.01); H04N 9/3194 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10028 (2013.01);
Abstract

In described examples, structured light elements are projected for display on a projection screen surface. The projected light elements are captured for determining a three-dimensional characterization of the projection screen surface. A three-dimensional characterization of the projection screen surface is generated in response to the displayed structured light elements. An observer perspective characterization of the projection screen surface is generated in response to an observer position and the three-dimensional characterization. A depth for at least one point of the observer perspective characterization is determined in response to depth information of respective neighboring points of the at least one point of the observer perspective characterization. A compensated image can be projected on the projection screen surface in response to the observer perspective characterization and depth information of respective neighboring points of the at least one point of the observer perspective characterization.


Find Patent Forward Citations

De La Cruz, Jaime. (2020). Camera-assisted arbitrary surface characterization and slope-based correction (U.S. Patent No. 10681318). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10681318

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