The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Aug. 31, 2017
Applicant:

Nxp B.v., Eindhoven, NL;

Inventors:

Gernot Hueber, Linz, AT;

Leonhard Kormann, Stallhofen, AT;

Ian Thomas Macnamara, Graz, AT;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 7/38 (2006.01); H03H 7/01 (2006.01); H04L 25/49 (2006.01); G01R 27/02 (2006.01); H04L 25/02 (2006.01); H03H 11/12 (2006.01); H03H 7/46 (2006.01);
U.S. Cl.
CPC ...
H03H 7/38 (2013.01); G01R 27/02 (2013.01); H03H 7/01 (2013.01); H03H 7/468 (2013.01); H03H 11/1278 (2013.01); H03H 11/1291 (2013.01); H04L 25/0278 (2013.01); H04L 25/49 (2013.01);
Abstract

Aspects of the disclosure are directed to auto-sweeping impedance-matching circuitry that matches an impedance of an RF antenna. As may be implemented in accordance with one or more embodiments, a transmitter that is configured and arranged to transmit signals to remote devices via the RF antenna, is used to communicate a plurality of test signals to the impedance-matching circuitry, with each test signal having a designated frequency and/or test signal pattern that is different than the designated frequency and/or test signal pattern of the other test signals. A characteristic of each of the test signals as passed through the impedance-matching circuitry is detected. For each of the test signals generated for the auto-sweep, the detected characteristic is compared to an expected characteristic for the test signal, and an output indicative of compliance of the impedance-matching circuitry with a design specification is generated and transmitted in response to the comparison.


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