The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Feb. 27, 2018
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Keith Ryan Green, Prosper, TX (US);

Dok Won Lee, Mountain View, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 43/06 (2006.01); G01R 15/20 (2006.01); G01R 33/07 (2006.01); H01L 27/22 (2006.01); H01L 23/48 (2006.01);
U.S. Cl.
CPC ...
H01L 43/065 (2013.01); G01R 15/202 (2013.01); G01R 33/077 (2013.01); H01L 23/481 (2013.01); H01L 27/22 (2013.01);
Abstract

A Hall effect sensor comprises a semiconductor substrate, a first well formed in the semiconductor substrate, a first ohmic contact formed in the first well, a second ohmic contact formed in the first well, a first terminal electrically coupled to the first ohmic contact, a second terminal electrically coupled to the second ohmic contact, and a first metal layer formed over the semiconductor substrate. The first metal layer comprises a first interconnect and a first trace, where the first trace is formed over the first well, and where the first interconnect electrically couples a first part of the first well to a second part of the first well. The first and second ohmic contacts are each positioned between the first part and the second part of the first well, where the first interconnect is electrically isolated from the first trace.


Find Patent Forward Citations

Loading…