The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Sep. 06, 2017
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventors:
Assignee:
SK hynix Inc., Icheon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); H01L 21/66 (2006.01); G11C 29/12 (2006.01); G11C 29/18 (2006.01); G01R 31/28 (2006.01); G11C 29/02 (2006.01); G11C 29/50 (2006.01); G01R 31/50 (2020.01); G11C 29/04 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
H01L 22/34 (2013.01); G01R 31/2853 (2013.01); G01R 31/2856 (2013.01); G01R 31/50 (2020.01); G11C 29/025 (2013.01); G11C 29/1201 (2013.01); G11C 29/18 (2013.01); G11C 29/50008 (2013.01); H01L 22/32 (2013.01); G11C 2029/0403 (2013.01); G11C 2029/0407 (2013.01); H01L 25/0657 (2013.01); H01L 2225/0651 (2013.01); H01L 2225/06586 (2013.01);
Abstract
A semiconductor device, a test method, and a system including the same are disclosed, which may relate to a technology for testing open and short states of a pad of a semiconductor device.