The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Dec. 26, 2017
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventor:

Tsuyoshi Takeda, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H01L 21/66 (2006.01); H01L 21/67 (2006.01); C23C 16/50 (2006.01); C23C 16/52 (2006.01); C23C 16/455 (2006.01); C23C 16/505 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32935 (2013.01); C23C 16/45542 (2013.01); C23C 16/50 (2013.01); C23C 16/505 (2013.01); C23C 16/52 (2013.01); H01J 37/32155 (2013.01); H01L 21/67253 (2013.01); H01L 22/26 (2013.01); H01J 37/32183 (2013.01); H01J 37/32541 (2013.01); H01J 2237/2485 (2013.01); H01J 2237/24564 (2013.01); H01J 2237/327 (2013.01); H01J 2237/3321 (2013.01); H01L 21/0217 (2013.01); H01L 21/0228 (2013.01); H01L 21/02211 (2013.01); H01L 21/02274 (2013.01);
Abstract

Described herein is a technique capable of uniformly processing substrates. According to the technique described herein, there is provided a substrate processing apparatus including: a process chamber where a substrate is processed; a gas supply configured to supply a gas into the process chamber; a plasma generator configured to plasma-excite the gas supplied into the process chamber, the plasma generator including an electrode electrically connected to a high frequency power source; an impedance meter configured to measure an impedance of the plasma generator; a determiner configured to determine an amount of active species generated by the plasma generator based on the impedance measured by the impedance meter; and a controller configured to control the high frequency power source based on the amount of active species determined by the determiner.


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