The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Oct. 28, 2013
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Guoan Zheng, Vernon, CT (US);

Changhuei Yang, Alhambra, CA (US);

Roarke Horstmeyer, San Marino, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G02B 27/58 (2006.01); G21K 7/00 (2006.01); G06K 9/00 (2006.01); G02B 21/36 (2006.01); G01B 1/00 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G21K 7/00 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01); G02B 27/58 (2013.01); G06K 9/00134 (2013.01); G02B 21/002 (2013.01);
Abstract

Systems, devices, and methods of Fourier ptychographic imaging configured for illuminating a specimen being imaged from a plurality of incidence angles, for acquiring variably-illuminated, low-resolution intensity images of the specimen, and for reconstructing a high-resolution image of the specimen by iteratively determining the high resolution image that is self-consistent with the variably-illuminated, low-resolution intensity images, for example, by updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.


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