The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Oct. 12, 2018
Shanghai Tianma Micro-electronics Co., Ltd., Shanghai, CN;
Tianma Micro-electronics Co., Ltd., Shenzhen, CN;
Conghua Ma, Shanghai, CN;
SHANGHAI TIANMA MICRO-ELECTRONICS CO., LTD., Shanghai, CN;
TIANMA MICRO-ELECTRONICS CO., LTD., Shenzhen, CN;
Abstract
The present disclosure provides an array substrate, a testing method, a display panel and a display apparatus. The array substrate includes: multiple gate wires and data wires intersecting with each other to divide multiple sub-pixel regions, where the sub-pixels corresponding to each of the data wires form a column of the sub-pixels, and M neighboring columns of the sub-pixels form a sub-pixel group; multiple switch units, where a first end of each of the switch units is electrically connected to one of the data wires; and multiple testing ends, each of which is electrically connected to second ends of the switch units. In such configuration, at least two switch units are electrically connected to the data wires corresponding to icolumns of the sub-pixels in at least two alternately arranged sub-pixel groups, respectively. Accordingly, impacts to voltage of common electrodes may be avoided and testing effect may be improved.