The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Sep. 13, 2017
Applicant:

Ignis Innovation Inc., Waterloo, CA;

Inventors:

Gholamreza Chaji, Waterloo, CA;

Joseph Marcel Dionne, Waterloo, CA;

Yaser Azizi, Waterloo, CA;

Javid Jaffari, Kitchener, CA;

Abbas Hormati, Kitchener, CA;

Tong Liu, Waterloo, CA;

Stefan Alexander, Waterloo, CA;

Assignee:

Ignis Innovation Inc., Waterloo, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G09G 3/3233 (2016.01); G01R 31/44 (2020.01); G09G 3/3283 (2016.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 31/44 (2013.01); G09G 3/3233 (2013.01); G09G 3/3283 (2013.01); G09G 2300/0842 (2013.01); G09G 2320/029 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/0285 (2013.01); G09G 2320/0295 (2013.01); G09G 2320/043 (2013.01); G09G 2320/045 (2013.01);
Abstract

Methods and systems to provide baseline measurements for aging compensation for a display device are disclosed. An example display system has a plurality of active pixels and a reference pixel. Common input signals are provided to the reference pixel and the plurality of active pixels. The outputs of the reference pixel is measured and compared to the output of the active pixels to determine aging effects. The display system may also be tested applying a first known reference current to a current comparator with a second variable reference current and the output of a device under test such as one of the pixels. The variable reference current is adjusted until the second current and the output of the device under test is equivalent of the first current. The resulting current of the device under test is stored in a look up table for a baseline for aging measurements during the display system operation. The display system may also be tested to determine production flaws by determining anomalies such as short circuits in pixel components such as OLEDs and drive transistors.


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