The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Dec. 17, 2018
General Electric Company, Schenectady, NY (US);
Brian David Yanoff, Niskayuna, NY (US);
Mingye Wu, Glenville, NY (US);
Lin Fu, Niskayuna, NY (US);
Peter Michael Edic, Albany, NY (US);
Xue Rui, Jersey City, NJ (US);
Geng Fu, Rexford, NY (US);
Yannan Jin, Niskayuna, NY (US);
Fredrik Gronberg, Stockholm, SE;
GENERAL ELECTRIC COMPANY, Niskayuna, NY (US);
Abstract
A method for imaging an object to be reconstructed includes acquiring projection data corresponding to the object. Furthermore, the method includes generating a measured sinogram based on the acquired projection data and formulating a forward model, where the forward model is representative of a characteristic of the imaging system. In addition, the method includes generating an estimated sinogram based on an estimated image of the object and the forward model and formulating a statistical model based on at least one of pile-up characteristics and dead time characteristics of a detector of the imaging system. Moreover, the method includes determining an update corresponding to the estimated image based on the statistical model, the measured sinogram, and the estimated sinogram and updating the estimated image based on the determined update to generate an updated image of the object. Additionally, the method includes outputting a final image of the object.