The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
May. 24, 2018
Applicant:
Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;
Inventors:
Shintaro Muraoka, Hachioji, JP;
Shikou Kaneko, Tokorozawa, JP;
Assignee:
KONICA MINOLTA, INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/20 (2017.01); G06T 5/00 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/20 (2013.01); G06T 5/008 (2013.01); G06T 7/0016 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30061 (2013.01);
Abstract
A dynamic analysis system includes an imaging unit, an attenuation process unit and an analysis unit. The imaging unit images a dynamic state of a subject, thereby generating a plurality of frame images showing the dynamic state of the subject. The attenuation process unit performs an attenuation process to attenuate an image signal component of a product in the frame images. The analysis unit analyzes the dynamic state of the subject based on the frame images after the attenuation process.