The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Jul. 12, 2017
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Ripon K. Saha, Santa Clara, CA (US);
Mukul R. Prasad, San Jose, CA (US);
FUJITSU LIMITED, Kawasaki, JP;
Abstract
According to an aspect of an embodiment, a method may include executing multiple tests with respect to code under test of a software program to perform multiple test executions. The method may further include identifying one or more passing tests and one or more failing tests of the test executions. In addition, the method may include determining an aggregated score for each statement based on two or more of: the passing tests and the failing tests; a semantic similarity between one or more statement tokens included in the respective statement and one or more report tokens included in an error report; and an amount of time that has passed from when the respective statement received a change. Moreover, the method may include identifying a particular statement of the plurality of statements as a fault location in the code under test based on the aggregated scores of the plurality of statements.