The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Apr. 02, 2018
Applicant:

Cisco Technology, Inc., San Jose, CA (US);

Inventors:

Xinyuan Huang, San Jose, CA (US);

Johnu George, San Jose, CA (US);

Marc Solanas Tarre, San Jose, CA (US);

Komei Shimamura, London, GB;

Purushotham Kamath, San Jose, CA (US);

Debojyoti Dutta, Santa Clara, CA (US);

Assignee:

CISCO TECHNOLOGY, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 9/48 (2006.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 3/0613 (2013.01); G06F 3/067 (2013.01); G06F 3/0661 (2013.01); G06F 9/4843 (2013.01); G06F 16/256 (2019.01);
Abstract

Aspects of the technology provide improvements to a Serverless Computing (SLC) workflow by determining when and how to optimize SLC jobs for computing in a Distributed Computing Framework (DCF). DCF optimization can be performed by abstracting SLC tasks into different workflow configurations to determined optimal arrangements for execution in a DCF environment. A process of the technology can include steps for receiving an SLC job including one or more SLC tasks, executing one or more of the tasks to determine a latency metric and a throughput metric for the SLC tasks, and determining if the SLC tasks should be converted to a Distributed Computing Framework (DCF) format based on the latency metric and the throughput metric. Systems and machine-readable media are also provided.


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