The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
May. 12, 2015
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Assignee:
HITACHI, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0608 (2013.01); G06F 3/065 (2013.01); G06F 3/068 (2013.01); G06F 3/0641 (2013.01); G06F 3/0689 (2013.01); G06F 12/00 (2013.01);
Abstract
This storage system is designed to: divide data into a plurality of chunk data (pieces of data) in a deduplication process; select one or more chunk data from among the plurality of chunk data in accordance with a sampling period which indicates that, on average, one chunk data be selected from among each N chunk data; and calculate a fingerprint, such as a hash value, for each of one or more characteristic chunk data, which are the selected one or more chunk data, and determine whether data including the one or more characteristic chunk data is a duplication. The storage system changes the sampling period on the basis of the results of past deduplication processes.