The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
May. 07, 2018
Honeywell International Inc., Morris Plains, NJ (US);
Sanjay K. Dave, Bangalore, IN;
Andrew John Trenchard, Romsey, GB;
Christopher J. Webb, Scottsdale, AZ (US);
Matthew G. Grizzle, Phoenix, AZ (US);
Mandar Vartak, Bangalore, IN;
Sriram Hallihole, Bangalore, IN;
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A method includes obtaining data associated with operation of a model-based industrial process controller. The method also includes identifying at least one estimated impact of at least one operational problem of the industrial process controller, where each estimated impact is expressed in terms of a lost opportunity associated with operation of the industrial process controller. The method further includes presenting the at least one estimated impact to a user. The at least one estimated impact could include impacts associated with noise or variance in process variables used by the industrial process controller, misconfiguration of an optimizer in the industrial process controller, one or more limits on one or more process variables, a quality of at least one model used by the industrial process controller, a quality of one or more inferred properties used by the industrial process controller, or one or more process variables being dropped from use by the industrial process controller.