The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Apr. 01, 2016
Wisconsin Alumni Research Foundation, Madison, WI (US);
Jan Huisken, Dresden, DE;
Gopi Shah, Dresden, DE;
Wisconsin Alumni Research Foundation, Madison, WI (US);
Abstract
Method for imaging regions of a sample using a light source and an optical detection means and at least one device for moving the sample in three dimensions, comprising the following method steps: a) introducing at least one magnetic element into the sample, b) applying a magnetic field by means of the at least one device for moving the sample in three dimensions, the magnetic field interacting with the at least one magnetic element introduced into the sample, c) arranging the region of the sample in a radiation region of the light source and in a detection region of the detection means, d) emitting first light beams from the light source onto the sample, e) generating second light beams by means of the sample, f) recording an image of a region of the sample by capturing a proportion, incident on the detection means from the sample, of the second light beams, g) moving the at least one magnetic element and the sample containing this at least one magnetic element by varying the magnetic field, h) repeating steps d) to g) until a predeterminable number of images have been recorded.