The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Nov. 21, 2017
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventors:

Akihiro Fujii, Tokyo, JP;

Yosuke Tani, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G06T 7/50 (2017.01); G06T 5/50 (2006.01); G01B 11/24 (2006.01); G01B 9/04 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G01B 9/04 (2013.01); G01B 11/24 (2013.01); G02B 21/00 (2013.01); G02B 21/0024 (2013.01); G02B 21/0036 (2013.01); G02B 21/0072 (2013.01); G06T 5/50 (2013.01); G06T 7/50 (2017.01); G06T 2207/10056 (2013.01); G06T 2207/20021 (2013.01);
Abstract

A scanning confocal microscope apparatus includes: a scanning confocal microscope that includes an objective lens; a computing device that divides a range in a direction of an optical axis of the objective lens of a preliminary scanning area on which preliminary scanning has been performed into a plurality of groups, in accordance with data obtained by performing the preliminary scanning using the scanning confocal microscope; and a controller that controls the scanning confocal microscope so as to perform principal scanning in which at least a portion of the preliminary scanning area is scanned under a measurement condition determined for each of the plurality of groups.


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