The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
May. 31, 2017
Lockheed Martin Corporation, Bethesda, MD (US);
John B. Stetson, New Hope, NJ (US);
Arul Manickam, Mount Laurel, NJ (US);
Peter G. Kaup, Marlton, NJ (US);
Gregory Scott Bruce, Abington, PA (US);
Wilbur Lew, Mount Laurel, NJ (US);
Joseph W. Hahn, Erial, NJ (US);
Nicholas Mauriello Luzod, Seattle, WA (US);
Kenneth Michael Jackson, Westville, NJ (US);
Jacob Louis Swett, Redwood City, CA (US);
Peter V. Bedworth, Los Gatos, CA (US);
Steven W. Sinton, Palo Alto, CA (US);
Duc Huynh, Princeton Junction, NJ (US);
Michael John Dimario, Doylestown, PA (US);
Jay T. Hansen, Hainesport, NJ (US);
Andrew Raymond Mandeville, Delran, NJ (US);
Bryan Neal Fisk, Madison, AL (US);
Joseph A. Villani, Moorestown, NJ (US);
Jon C. Russo, Cherry Hill, NJ (US);
David Nelson Coar, Philadelphia, PA (US);
Julie Lynne Miller, Auberry, CA (US);
Anjaney Pramod Kottapalli, San Jose, CA (US);
Gary Edward Montgomery, Palo Alto, CA (US);
Margaret Miller Shaw, Silver Spring, MD (US);
Stephen Sekelsky, Princeton, NJ (US);
James Michael Krause, Saint Michael, MN (US);
Thomas J. Meyer, Corfu, NY (US);
LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);
Abstract
A system for magnetic detection includes a magneto-optical defect center material including at least one magneto-optical defect center that emits an optical signal when excited by an excitation light; a radio frequency (RF) exciter system configured to provide RF excitation to the magneto-optical defect center material; an optical light source configured to direct the excitation light to the magneto-optical defect center material; and an optical detector configured to receive the optical signal emitted by the magneto-optical defect center material.