The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Dec. 08, 2016
Applicant:

Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;

Inventor:

Tatsuya Onishi, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2002 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01T 1/2018 (2013.01); G01T 1/244 (2013.01);
Abstract

An X-ray detection device is a device detecting X-rays having transmitted through a test subject, and comprises a filter member including a filter that attenuates some of X-rays, a detector that detects the X-rays partially attenuated by the filter, and a housing that places the detector therein. The housing includes a principal surface including a slit capable of going through the X-rays, and a side surface including an opening which extends in the direction orthogonal to the principal surface and through which the filter can be inserted. The filter of the filter member is disposed in the housing so as to cover a line sensor of the detector and a scintillator in a state of being apart from the detector.


Find Patent Forward Citations

Onishi, Tatsuya. (2020). Radiation detection device, radiation inspection system, and method for adjusting radiation detection device (U.S. Patent No. 10677938). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10677938

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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