The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
May. 09, 2018
Fluke Corporation, Everett, WA (US);
Christian Karl Schmitzer, Brunn/Gebirge, AT;
Ronald Steuer, Hinterbruhl, AT;
Ricardo Rodriguez, Mill Creek, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
Systems and methods for operating and calibrating measurement devices are provided herein. The measurement devices generate reference current signals and sense the reference current signals in a conductor under test, which sensed signals are used to determine a calibration factor or a position of the conductor under test. A calibration system may control a calibration voltage source to selectively output calibration voltages in a calibration conductor. The calibration system may obtain data from the electrical parameter measurement device captured by the electrical parameter measurement device when measuring the calibration conductor. Such data may include one or more reference current measurements, one or more voltage measurements, etc. The calibration system utilizes the obtained measurements to generate calibration data which may be stored on the voltage measurement device for use thereby during subsequent operation. The calibration data may include one or more lookup tables, coefficients for one or more mathematical formulas, etc.