The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Dec. 23, 2013
Applicant:

Posco, Pohang-si, Gyeongsangbuk-do, KR;

Inventors:

Ju-Seung Lee, Pohang-si, KR;

Sang-Woo Choi, Pohang-si, KR;

Se-Ho Choi, Pohang-si, KR;

Jong-Pil Yun, Pohang-si, KR;

Ho-Moon Bae, Pohang-si, KR;

Assignee:

POSCO, Pohang-si, Gyeongsangbuk-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01N 27/83 (2006.01); B21B 38/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/82 (2013.01); B21B 38/00 (2013.01); G01N 27/83 (2013.01);
Abstract

An apparatus for detecting inner defects of a steel plate comprises an all-defect detection unit for detecting all defects including surface defects present on the surface of the steel plate and inner defects present inside the steel plate by intensity of leakage flux, measured by generating magnetic flux in a strike direction of the steel plate; a surface defect detection unit for detecting surface defects by intensity of leakage flux, measured by generating magnetic flux in the thickness direction of the steel plate, for a predetermined detection region including all the defects detected by the all-defect detection unit; and a data processing unit for detecting only inner defects present in a detection region by excluding the detected surface defects from all the defects detected by the all-defect detection unit, for the detection region, thereby detecting only the inner defects of the steel plate.


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