The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Nov. 18, 2017
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Mark A. Schmier, II, Mesa, AZ (US);

Gary E. Jones, Mesa, AZ (US);

Ricky A. Kuehn, Mesa, AZ (US);

Heather Burns, Bothell, WA (US);

Carlos Portugal, Oceanside, CA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/20 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01);
Abstract

There is provided a measurement apparatus for obtaining conductivity measurements of a surface of a structure. The apparatus has a housing, and a pair of support legs depending from the housing. Each support leg has a first end, wherein the first ends define a support leg plane. The apparatus has a pair of conductive measurement probes slidably disposed between the support legs, and at least one force applying member coupled to the housing. The at least one force applying member applies a biasing force to cause the pair of conductive measurement probes to extend a predetermined distance beyond the support leg plane. A downward applied force applied to the housing, when the conductive measurement probes are in contact with the surface, causes a displacement of the conductive measurement probes, until the first ends of the support legs contact the surface. Conductivity measurements between the conductive measurement probes are consistently obtained.


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