The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Jul. 31, 2018
Applicant:

United States of America As Represented BY the Administrator of Nasa, Washington, DC (US);

Inventors:

John W. Connell, Yorktown, VA (US);

Frank L. Palmieri, Hampton, VA (US);

William T. Yost, Newport News, VA (US);

John W. Hopkins, Suffolk, VA (US);

Rodolfo I Ledesma, Hampton, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); H05H 1/00 (2006.01); B23K 26/12 (2014.01); B23K 26/08 (2014.01); B08B 7/00 (2006.01); B23K 26/50 (2014.01); G01N 21/71 (2006.01); G01J 3/443 (2006.01); B23K 26/0622 (2014.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); B08B 7/0042 (2013.01); B23K 26/0884 (2013.01); B23K 26/127 (2013.01); B23K 26/50 (2015.10); G01N 21/718 (2013.01); H05H 1/0037 (2013.01); B23K 26/0622 (2015.10); G01J 3/443 (2013.01);
Abstract

Systems, methods, and devices of the various embodiments may enable simultaneous preparation of a substrate for adhesive bonding and detection of minute contaminants on the substrate. Various embodiments may enable detection of contaminants on a surface of a substrate while the surface of the substrate is being prepared for adhesive bonding by laser ablation. Various embodiments may provide an integrated laser treatment and measurement system.


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