The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Sep. 24, 2018
Applicant:

Hitachi High-tech Science Corporation, Tokyo, JP;

Inventors:

Atsushi Uemoto, Tokyo, JP;

Tatsuya Asahata, Tokyo, JP;

Makoto Sato, Tokyo, JP;

Yo Yamamoto, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 27/10 (2006.01); H01J 37/18 (2006.01); G01N 1/32 (2006.01); G01N 1/44 (2006.01); G01N 1/28 (2006.01); H01J 37/31 (2006.01); H01J 37/317 (2006.01);
U.S. Cl.
CPC ...
G01N 1/44 (2013.01); G01N 1/28 (2013.01); H01J 37/31 (2013.01); H01J 37/317 (2013.01);
Abstract

According to one embodiment, an automatic sample preparation apparatus includes: a charged particle beam irradiation optical system configured to perform irradiation with a charged particle beam; a sample stage configured to move with the sample placed thereon; a sample piece transfer device for holding and transferring the sample piece separated and extracted from the sample; a sample piece holder-fixing bed configured to hold a sample piece holder to which the sample piece is transferred; a gas supply portion configured to irradiate gas forming a deposition film with the charged particle beam; and a computer configured to control the charged particle beam irradiation optical system, the sample piece transfer device, and the gas supply portion to transfer and stop the sample piece held by the sample piece transfer device with a gap between the sample piece holder and the sample piece, and connect the sample piece to the sample piece holder.


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