The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

May. 06, 2019
Applicant:

Badger Meter, Inc., Milwaukee, WI (US);

Inventors:

Shahram Javey, Los Gatos, CA (US);

Douglas Bergh, Los Gatos, CA (US);

Assignee:

Badger Meter, Inc., Milwaukee, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 15/06 (2006.01); G06Q 50/06 (2012.01); G01F 15/075 (2006.01); G01F 15/00 (2006.01);
U.S. Cl.
CPC ...
G01F 15/061 (2013.01); G01F 15/003 (2013.01); G01F 15/0755 (2013.01); G06Q 50/06 (2013.01);
Abstract

A computer implemented method implemented on a computer system includes non-transient memory storing instructions for configuring a plurality of district metering areas within a utility supply network. The method includes identifying a plurality of flow measurement devices, wherein each flow measurement device is connected by a directional connection to at least one other flow measurement device, generating a utility supply network representation based on the directional connections between the flow measurement devices, and generating a plurality of district metering areas for the utility supply network representation, each district metering area being a directed acyclic graph based on the directional connections and including a subset of the plurality of flow measuring devices and including at least one flow measurement device designated as a supply meter and at least one flow measurement device designated as a demand meter.


Find Patent Forward Citations

Javey, Shahram. (2020). System and method for utilizing district metering areas based on meter designations (U.S. Patent No. 10677629). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10677629

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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