The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Jul. 10, 2019
Grifols Worldwide Operations Limited, Dublin, IE;
Jordi Boira Bonhora, Parets del Valles, ES;
Carlos Roura Salietti, Parets del Valles, ES;
Jose Coca Garrote, Parets del Valles, ES;
GRIFOLS WORLDWIDE OPERATIONS LIMITED, Dublin, IE;
Abstract
A method and device detect defects in the closure of encapsulated vials. The method includes scanning a profile of the capsule and of the vial using a profilometer, thus obtaining a point cloud. From the point cloud obtained, calculating at least one of the following parameters: diameter or radius of the closure circumference of the capsule; angle of intersection between the lower skirt and the side of the capsule; length of the lower skirt; and/or a distance from the end of the lower skirt to the neck of the vial. The method determines whether any of the parameters calculated in the previous step exceeds a predetermined value. The device detecting defects in the closure of encapsulated vials includes a profilometer configured to scan a profile of the capsule and of the vial and a control device configured to execute the method.