The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Mar. 29, 2018
Gagemaker, Lp, Pasadena, TX (US);
Jimmy I. Frank, San Antonio, TX (US);
Kris Dawson, Pearland, TX (US);
Gagemaker, LP, Pasadena, CA (US);
Abstract
A metrological instrument configured to measure diameters comprises one or more guide rails, a plurality of clamping blocks configured to removably or releaslably securely locate the blocks on the one or more guide rails, and also configured to removably or releaslably securely clamp a measurement arm substantially normal to the one or more guide rails. A displacement transducer, such as a dial indicator or a digital indicator, may be disposed at an end of one or more of the measurement arms for determining a displacement, relative or absolute, between the measurement arms. To provide the required measurement accuracy, precision, and repeatability, the instrument may be configured with carbon fiber reinforced composite guide rails, and/or measurement arms.