The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Sep. 29, 2017
General Electric Company, Schenectady, NY (US);
Nicholas Konkle, Waukesha, WI (US);
Marc Schaepkens, Troy, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
An imaging system and detector for obtaining x-ray images of a region of interest (ROI) within an object is provided that does not require movement of the detector and/or object/patient for alignment with the x-ray source. The detector is formed with an array of detector elements disposed on a substrate that has an area larger than the area of the objects/patients to be imaged. In use, the object/patient is positioned between the x-ray source and the detector and the x-ray source is targeted at the ROI. The control mechanism determines the area of the detector aligned with the x-ray source and ROI and operates the selected detector elements in the area struck by the x-rays from the source passing through the ROI of the object/patient. The control mechanism receives image data from the area of the detector formed by the detector elements in order to form images of the ROI.