The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 2020
Filed:
Dec. 05, 2018
Siemens Healthcare Gmbh, Erlangen, DE;
Steffen Kappler, Effeltrich, DE;
Achim Hillenbrand, Erlangen, DE;
SIEMENS HEALTHCARE GMBH, Erlangen, DE;
Abstract
A method is for calibrating an X-ray measuring facility. The method includes preparing the facility for measurement for a resolution of a plurality of different energy intervals; positioning a test object in a beam path of an X-ray beam; irradiating the test object via the X-ray beam, and during the irradiating, an intensity measurement of the test object appropriately resolved according to the energy intervals is carried out by the facility; determining an absorption function of the test object using the intensity measurement; preparing one of the energy intervals as a reference interval such that the absorption function has a negligible energy dependency over the reference interval; determining a correction function of the absorption function, for at least one further energy interval of the energy intervals, using at least one value of the absorption function in the reference interval; and calibrating the facility using the correction function determined.