The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 2020

Filed:

Nov. 30, 2016
Applicant:

Ezono Ag, Jena, DE;

Inventors:
Assignee:

EZONO AG, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); A61B 5/06 (2006.01); A61B 8/08 (2006.01); G01R 33/02 (2006.01); G01B 7/00 (2006.01); A61B 34/20 (2016.01); A61B 8/14 (2006.01); A61B 8/00 (2006.01); G01R 35/00 (2006.01); H01F 13/00 (2006.01); H01F 7/02 (2006.01); A61B 5/053 (2006.01);
U.S. Cl.
CPC ...
A61B 5/062 (2013.01); A61B 8/0833 (2013.01); A61B 8/14 (2013.01); A61B 8/4254 (2013.01); A61B 8/4494 (2013.01); A61B 34/20 (2016.02); G01B 7/003 (2013.01); G01R 33/02 (2013.01); G01R 33/0206 (2013.01); G01R 35/005 (2013.01); H01F 7/0273 (2013.01); H01F 13/003 (2013.01); A61B 5/0536 (2013.01); A61B 2034/2051 (2016.02);
Abstract

A method of obtaining information about the position and/or orientation of a magnetic component relatively to a magnetometric detector, the magnetic component and the magnetometric detector being moveable independently from each other relatively to a static secondary magnetic field, the method comprising the steps of: measuring in the presence of the combination of both the magnetic field of the magnetic component and the static secondary magnetic field essentially simultaneously the strength and/or orientation of a magnetic field at at least a first position and a second position spatially associated with the magnetometric detector, the second position being distanced from the first position; and combining the results of the measurements to computationally eliminate the effect of the secondary magnetic field and derive the information about the position and/or orientation of the magnetic component.


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