The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Apr. 11, 2019
Infineon Technologies Ag, Neubiberg, DE;
Manoj Kurvathodil, Linz, AT;
Thomas Obermueller, Linz, AT;
Infineon Technologies AG, Neubiberg, DE;
Abstract
Noise test systems, methods, and circuitries are provided for determining a noise characteristic of a receiver. In one example, an integrated circuit device includes an active RF receiver element configured to process a radio frequency (RF) signal to generate a receiver signal; an up-conversion mixer configured to up-convert a test signal to generate an RF test signal; an attenuator configured to selectively adjust a power of the RF test signal to generate adjusted RF test signals; and a coupler configured to couple the adjusted RF test signals to an input of the active RF receiver element. In another example, instead of or in addition to the attenuator, the integrated circuit device includes first, second, and third power sensors configured to measure a power of the test signal, the RF test signal, and the receiver signal, respectively. The power measurements are used to determine the noise characteristic.