The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Sep. 20, 2018
Applicant:

Silicon Laboratories Inc., Austin, TX (US);

Inventors:

Matthew Powell, Austin, TX (US);

Sudipta Sarkar, Austin, TX (US);

Assignee:

Silicon Laboratories Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03B 5/06 (2006.01); H03B 5/36 (2006.01); H03L 3/00 (2006.01); H03K 21/38 (2006.01);
U.S. Cl.
CPC ...
H03B 5/06 (2013.01); H03B 5/366 (2013.01); H03K 21/38 (2013.01); H03L 3/00 (2013.01); H03B 2200/0094 (2013.01);
Abstract

Embodiments of clock circuits disclosed herein include a crystal oscillator circuit, an injection oscillator coupled to kick-start the crystal oscillator circuit and a digital frequency calibration circuit coupled to recalibrate the injection oscillator. The crystal oscillator circuit is configured to generate a clock signal at a resonant frequency. The injection oscillator is coupled to supply an oscillation signal at an injection frequency to the crystal oscillator circuit to reduce a start-up time of the crystal oscillator circuit. The digital frequency calibration circuit is coupled to receive the resonant frequency and the injection frequency as inputs, and configured to supply a digital control signal to the injection oscillator to set the injection frequency of the injection oscillator substantially equal to the resonant frequency of the crystal oscillator circuit. Methods are provided herein to recalibrate the injection frequency of an injection oscillator over time, temperature and/or supply voltage.


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