The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Nov. 08, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Chih-Chao Yang, Glenmont, NY (US);

Theo Standaert, Clifton Park, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 21/3213 (2006.01); C23C 18/54 (2006.01); H01L 21/321 (2006.01); H01L 21/28 (2006.01); C23C 18/16 (2006.01); C23C 18/38 (2006.01); C25D 7/12 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76807 (2013.01); H01L 21/32137 (2013.01); H01L 21/76843 (2013.01); H01L 21/76871 (2013.01); H01L 21/76874 (2013.01); H01L 21/76879 (2013.01); H01L 23/53223 (2013.01); H01L 23/53238 (2013.01); C23C 18/165 (2013.01); C23C 18/38 (2013.01); C23C 18/54 (2013.01); C25D 7/123 (2013.01); H01L 21/28123 (2013.01); H01L 21/3212 (2013.01); H01L 2221/1036 (2013.01);
Abstract

Advanced dual damascene interconnects have been provided in which a metallic seed liner composed of an electrically conductive metal or metal alloy having a first bulk resistivity is located on sidewall surfaces and a bottom wall of a first metallic structure that is present in a via portion of a combined via/line opening that is present in an interconnect dielectric material layer. The first metallic structure is composed of an electrically conductive metal or metal alloy that has a second bulk resistivity that is higher than the first bulk resistivity. In some embodiments, a second metal structure is present on a topmost surface of the first metallic structure. The second metallic structure is composed of an electrically conductive metal or metal alloy that differs from the electrically conductive metal or metal alloy of the first metallic structure.


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