The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Feb. 11, 2019
Applicant:
Biomerieux, Inc., Durham, NC (US);
Inventor:
James Arthur VanGordon, O'Fallon, MO (US);
Assignee:
bioMerieux, Inc., Durham, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/02 (2006.01); H01J 49/26 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); H01J 49/025 (2013.01);
Abstract
Methods for testing or adjusting a charged-particle detector are provided. A diagnostic and/or adjustment method for a charged-particle detector of an instrument includes providing, from a photon source, photons incident on the charged-particle detector. Moreover, the method includes detecting a response by the charged-particle detector to the photons incident thereon. Related detection systems are also provided.
Quick Actions:
VanGordon, James. (2020). Methods for testing or adjusting a charged-particle detector, and related detection systems (U.S. Patent No. 10672598). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10672598
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile