The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Jul. 19, 2017
Applicant:

Hamilton Sundstrand Corporation, Charlotte, NC (US);

Inventors:

Michael A. Wilson, Scottsdale, AZ (US);

Eduardo Ahuactzin Parra, Phoenix, AZ (US);

Assignee:

HAMILTON SUNSTRAND CORPORATION, Charlotte, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01F 7/06 (2006.01); H01H 47/32 (2006.01); H03K 17/18 (2006.01); H03K 17/082 (2006.01); H03K 19/0175 (2006.01); G05F 1/10 (2006.01);
U.S. Cl.
CPC ...
H01F 7/064 (2013.01); H01H 47/32 (2013.01); H03K 17/0826 (2013.01); H03K 17/18 (2013.01); H03K 19/017509 (2013.01); G05F 1/10 (2013.01);
Abstract

A solenoid electrical diagnostic system includes a solenoid circuit operable in response to an electrical current. A low-side switch includes a low-side input configured to receive a pulsed voltage signal and a low-side output in signal communication with the solenoid circuit. The low-side switch continuously switches between an on-state and an off-state based on the pulsed voltage signal to adjust a level of the current flowing through the solenoid circuit. A solenoid monitoring unit generates a low-side output state signal based on an output voltage at the low-side output, and a low-side input state signal based on an input voltage at the low-side input. The solenoid electrical diagnostic system further includes an electronic hardware controller determines at least one operating condition of the solenoid circuit based on a comparison between the state signals and a threshold value.


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