The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
May. 19, 2017
Applicant:
Siemens Healthcare Gmbh, Erlangen, DE;
Inventor:
Tom Weidner, Erlangen, DE;
Assignee:
Siemens Healthcare GmbH, Erlangen, DE;
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/20 (2018.01); A61B 6/00 (2006.01); A61B 6/02 (2006.01); A61B 5/103 (2006.01); A61B 8/08 (2006.01); A61B 6/04 (2006.01); G06T 7/00 (2017.01); G06F 19/00 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); A61B 5/103 (2013.01); A61B 6/025 (2013.01); A61B 6/463 (2013.01); A61B 6/502 (2013.01); A61B 8/0825 (2013.01); G06F 19/321 (2013.01); G06T 7/0012 (2013.01); A61B 6/0414 (2013.01); A61B 6/466 (2013.01); G06T 2207/30068 (2013.01);
Abstract
A method for monitoring a breast tissue examination is described. In the method, a completed diagnostic assessment of individual image slices of a slice image dataset to be examined in respect of breast tissue that is to be examined is registered automatically. In addition, information relating to the already assessed and the not yet assessed image slices is displayed to a user. An examination workflow monitoring device is also described. A diagnostic assessment station is described in addition.