The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Mar. 29, 2016
Consejo Superior DE Investigaciones Cientificas (Csic), Madrid, ES;
Universitat Politecnica DE Valencia, Valencia, ES;
Universitat DE Valencia, Valencia, ES;
Francisco Javier Albiol Colomer, Valencia, ES;
Alberto Corbi Bellot, Valencia, ES;
Celso Bellot Romero, Madrid, ES;
Alberto Albiol Colomer, Valencia, ES;
CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS (CSIC), Valencia, ES;
UNIVERSITAT DE VALENCIA, Valencia, ES;
Abstract
Device for extracting three-dimensional information from radiographic images of an object; process for calibrating said device; and process for generating said radiographic images includes an X-ray emitter and an X-ray sensor. A contour sensor represents contour points of an object by means of the radiation emitted or reflected by the object. The device also has a calibration framework with X-ray markers, and contour markers. The processes are based on taking contour and X-ray images of the calibration framework, first without an object of study and subsequently with one, taking into account the information provided by the markers, and the fact that the contour sensor is placed in the same manner with respect to the X-ray emitter in all the images taken.
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