The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Sep. 05, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Masayuki Murata, Tokyo, JP;

Hiroaki Nakamura, Kanagawa-ken, JP;

Junya Shimizu, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 50/04 (2012.01); G06Q 10/04 (2012.01); G06Q 10/06 (2012.01); G06F 17/11 (2006.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06Q 50/04 (2013.01); G06F 17/11 (2013.01); G06Q 10/04 (2013.01); G06Q 10/06 (2013.01); G06Q 10/1097 (2013.01); Y02P 90/20 (2015.11); Y02P 90/30 (2015.11);
Abstract

A method for interactive test-schedule adjustment is provided. The steps include: displaying a table including the importance and period of each test item; displaying a first optimum schedule obtained from an optimal solution based on values entered by a user into the table, the schedule including a use schedule of each test facilities used for each of the multiple test items; displaying a second optimum schedule obtained from an optimal solution recalculated by mathematical programming after a use schedule of a test item the importance of which is changed on the first optimum schedule is changed; and displaying a third optimum schedule based on neighborhood solutions obtained by a search method using a history of optimal solutions if no agreement between the users is obtained on the second schedule.


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