The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Apr. 26, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Wei S. Dong, Beijing, CN;

Chunhua Tian, Beijing, CN;

Yu Wang, Beijing, CN;

Yu Wang, Shanghai, CN;

Junchi Yan, Shanghai, CN;

Chao Zhang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 20/00 (2019.01); G06Q 10/06 (2012.01); G06K 9/62 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 17/18 (2013.01); G06K 9/6262 (2013.01); G06N 20/00 (2019.01); G06Q 10/06375 (2013.01);
Abstract

An approach for a computer to evaluate a predictive model includes identifying features of training samples in a set of training samples. The approach selects evaluation metrics from a set of evaluation metrics as available metrics using identified features and includes determining recommended metrics using the predictive model, the available metrics, and a predetermined set of user-preferred metrics. The approach applies the predictive model created using the set of training samples to a set of test samples to calculate values of the available metrics. The approach evaluates the predictive model by using the available metrics and the values of the available metrics to evaluate the predictive model by evaluating the predictive model using the recommended metrics and the values of the recommended metrics.


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