The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Mar. 29, 2019
Applicant:
Ambarella International Lp, Santa Clara, CA (US);
Inventors:
Leslie D. Kohn, Saratoga, CA (US);
Guy Rapaport, Sunnyvale, CA (US);
Assignee:
Ambarella International LP, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06K 9/00744 (2013.01); G06K 9/00758 (2013.01); G06K 9/4609 (2013.01); G06K 9/4671 (2013.01);
Abstract
A method of feature matching is provided. The method includes the steps of (A) determining a set of correspondences between a set of reference feature points for a first image and a set of target feature points for a second image using a processor to compute a descriptor matching function for each pair of reference and target feature points and (B) reducing the set of correspondences using the processor to perform an approximate cross-check to obtain a set of valid correspondences based upon the descriptor matching function computed for each pair of feature points.