The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Nov. 14, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Tetsuya Nasukawa, Kanagawa-ken, JP;

Kazuki Sato, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06F 17/27 (2006.01); G06T 11/60 (2006.01); G06F 16/583 (2019.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06F 17/2735 (2013.01); G06F 17/2765 (2013.01); G06T 11/60 (2013.01); G06F 16/583 (2019.01);
Abstract

A technique for use in analyzing multidimensional data is disclosed. In the technique, a subset of texts specified by a textual feature is selected from the multidimensional data. Each text of the subset is projected into a target image based on the corresponding spatial information to obtain a spatial distribution map for the textual feature. The similarity between the spatial distribution map for the textual feature and each property distribution map for each predefined property is determined. For the similarity exceeding a threshold, the textual feature is outputted as a notable textual feature.


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