The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Mar. 22, 2018
Applicant:

Equifax Inc., Atlanta, GA (US);

Inventors:

Rajkumar Bondugula, Marietta, GA (US);

Allan Joshua, Atlanta, GA (US);

Hongchao Li, Alpharetta, GA (US);

Hannah Wang, Suwanee, GA (US);

Assignee:

EQUIFAX INC., Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/295 (2020.01); G06N 5/04 (2006.01); G06N 20/00 (2019.01); G06F 16/35 (2019.01);
U.S. Cl.
CPC ...
G06F 40/295 (2020.01); G06F 16/353 (2019.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

Certain aspects produce a scoring model that can automatically classify future text samples. In some examples, a processing device perform operations for producing a scoring model using active learning. The operations includes receiving existing text samples and searching a stored, pre-trained corpus defining embedding vectors for selected words, phrases, or documents to produce nearest neighbor vectors for each embedding vector. Nearest neighbor selections are identified based on distance between each nearest neighbor vector and the embedding vector for each selection to produce a text cloud. Text samples are selected from the text cloud to produce seed data that is used to train a text classifier. A scoring model can be produced based on the text classifier. The scoring model can receive a plurality of new text samples and provide a score indicative of a likelihood of being a member of a selected class.


Find Patent Forward Citations

Loading…