The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Oct. 18, 2016
Beihang University, Beijing, CN;
Xiaoxiao Wang, Beijing, CN;
Pengyuan Jiao, Beijing, CN;
Donglin Su, Beijing, CN;
Aixin Chen, Beijing, CN;
BEIHANG UNIVERSITY, Beijing, CN;
Abstract
A transient IR-drop waveform measurement system and method for a high speed integrated circuit are provided. The system includes all-digital elements and is based on a ring oscillator in GHz. Through oscillation with a Fast Ring Oscillator, sampling with an Edge Detector and counting with a Ripple Counter, a width and a peak of an IR-drop waveform are obtained. Moreover, a power supply network is adapted during a clock cycle through sending an adaptation signal to a connected dynamic voltage frequency scaling (DVFS) system. The measurement method includes 11 steps. The measurement system has following features: 1) IR-drop peak/width measurement ability; 2) low fabrication and test cost; 3) high accuracy and sensitivity; 4) early adaptation ability. Therefore, the measurement system can be used alone for chip monitoring or testing, in order to reduce a power supply noise disturbance to a chip.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile