The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Nov. 26, 2014
General Electric Company, Schenectady, NY (US);
Kristen Alane McConnell, Pittsburgh, PA (US);
Gretchen Marie Mendoza, Pittsburgh, PA (US);
Anna Louise Von Reden, Pittsburgh, PA (US);
Bryon Pigg, Pittsburgh, PA (US);
Francesco DeSensi, Pittsburgh, PA (US);
Gregory Hopkins, Pittsburgh, PA (US);
Michael Butler, Pittsburgh, PA (US);
Xiaoyu Chen Kaess, Pittsburgh, PA (US);
Rasu Shrestha, Pittsburgh, PA (US);
General Electric Company, Schenectady, NY (US);
Abstract
Disclosed and described systems, methods, and apparatus provide diagnostic display and analysis of patient data. An example radiology desktop system includes a workload manager that organizes and displays one or more worklists. The example workload manager retrieves and displays, based on receiving a selection of an active worklist, one or more exams associated with the active worklist. The example system includes a diagnostic hub triggered based on selection of an exam. The example diagnostic hub generates an exam preview panel provides a summary of the selected exam. The example diagnostic hub facilitates comparison, based on selection of a comparison exam via the user interface from a patient library, between the selected exam and the comparison exam via the diagnostic hub. The example diagnostic hub updates a worklist entry for the selected exam based on an analysis resulting from the comparison between the selected exam and the comparison exam.