The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Nov. 29, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Sebastian Nelke, Frickenhausen, DE;

Martin Oberhofer, Sindelfingen, DE;

Yannick Saillet, Stuttgart, DE;

Jens Seifert, Gaertringen, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 16/25 (2019.01); G06F 16/901 (2019.01); G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 16/254 (2019.01); G06F 16/215 (2019.01); G06F 16/902 (2019.01);
Abstract

Embodiments relate to processing a data set stored in a computer system. In one aspect, a method of processing a data set stored in a computer system includes providing one or more parameters for quantifying data quality of the data set. A processor generates, for each parameter of the one or more parameters, a reference pattern indicating a dysfunctional behavior of the values of the parameter. The data set is processed to obtain values of the one or more parameters. A parameter of the one or more parameters is identified whose obtained values match a corresponding reference pattern of the generated reference patterns. The identified parameter is assigned a resource weight value indicating the amount of processing resources required to fix the dysfunctional behavior of the identified parameter.


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