The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Mar. 31, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Assaf Natanzon, Tel Aviv, IL;

Leehod Baruch, Rishon Leziyon, IL;

Jehuda Shemer, Kfar Saba, IL;

Saar Cohen, Moshav, IL;

Slavik Neymer, Petah Tikva, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/23 (2019.01); G06F 11/14 (2006.01); G06F 11/16 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 11/1407 (2013.01); G06F 11/1446 (2013.01); G06F 11/1604 (2013.01); G06F 11/3075 (2013.01); G06F 2201/84 (2013.01);
Abstract

A method, system, and computer program product for determining a consistent point in time in a replication environment comprising determining periods of time that no IO was received from sources; wherein the periods are determined to account for differences between the clocks of the sources and the clock at a replication appliance, adjusting the periods of time that no IO was received by at least one delay factor, comparing the adjusted periods of time from the sources to determine a common period of time; wherein the common point in time denotes that each source was in a consistent state and marking the adjusted point in time as a consistent point in time in a journal.


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