The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Feb. 12, 2018
Ca, Inc., New York, NY (US);
Smrati Gupta, San Jose, CA (US);
Erhan Giral, Saratoga, CA (US);
CA, Inc., New York, NY (US);
Abstract
Instead of attempting to scan all metric measurements of a distributed application, an anomaly detector intelligently selects instances of metrics from the universe of metric instances available for the distributed application to detect anomalies. Intelligent feature selection allows the anomaly detector to efficiently and reliably detect anomalies for a distributed application. The intelligent selection is guided by execution paths of transactions of the distributed application, and the execution paths are determined from a topology of the distributed application. The anomaly detector scans the incoming time-series data of the selected metric instances by transaction type and determines whether the scanned measurements across the selected metric instances form a pattern correlated with anomalous behavior.